Optimizing testing efficiency with error-prone path identification and genetic algorithms

James R. Birt*, Renate Sitte

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

15 Citations (Scopus)

Abstract

This paper presents a method for optimizing software testing efficiency by identifying the most error prone path clusters in a program. We do this by developing variable length Genetic Algorithms that optimize and select the software path clusters which are weighted with sources of error indexes. Although various methods have been applied to detecting and reducing errors in a whole system, there is little research into partitioning a system into smaller error prone domains for testing. Exhaustive software testing is rarely possible because it becomes intractable for even medium sized software. Typically only parts of a program can be tested, but these parts are not necessarily the most error prone. Therefore, we are developing a more selective approach to testing by focusing on those parts that are most likely to contain faults, so that the most error prone paths can be tested first. By identifying the most error prone paths, the testing efficiency can be increased.

Original languageEnglish
Title of host publicationProceedings - 2004 Australian Software Engineering Conference ASWEC 2004
EditorsP. Strooper
PublisherIEEE Computer Society
Pages106-115
Number of pages10
Volume2004
ISBN (Print)0-7695-2089-8
DOIs
Publication statusPublished - 2004
Externally publishedYes
Event15th Australian Software Engineering Conference - Melbourne, Australia
Duration: 13 Apr 200416 Apr 2004

Conference

Conference15th Australian Software Engineering Conference
CountryAustralia
CityMelbourne
Period13/04/0416/04/04

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Cite this

Birt, J. R., & Sitte, R. (2004). Optimizing testing efficiency with error-prone path identification and genetic algorithms. In P. Strooper (Ed.), Proceedings - 2004 Australian Software Engineering Conference ASWEC 2004 (Vol. 2004, pp. 106-115). IEEE Computer Society. https://doi.org/10.1109/ASWEC.2004.1290463