Nano-resolution X-ray tomography for deciphering wiring diagram of mammalian brain

H. Mizutani*, H. Sagara, A. Takeuchi, Takuji Ohigashi, Wataru Yashiro, K. Uesugi, Y. Suzuki, Atsushi Momose, Toshihisa Takagi

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

1 Citation (Scopus)


Neural circuits in the central nervous system are the substrate of various high-order brain functions. However, little is known about the mechanisms underlying neuronal information processing in the brain. Anatomical and functional graph structures of neural networks with actual connections will provide us with perspectives to elucidate the brain complexity. Here, we aim to develop a three-dimensional mouse brain atlas of neural circuits using nano-resolution x-ray tomography by synchrotron radiation. In addition to identifying a large number of synapses, our research will also clarify the structure of neuronal networks for understanding the most complex organ in the body. In this study, we observed metal-stained biological tissues of the mouse brain using hard x-ray Zernike-type phase-contrast microscopy with 60-nm resolution at SPring-8. As a result, the nano-resolution hard x-ray phase-contrast microscope revealed nerve fibers and organelles including mitochondria and synapses in the neural tissue. In the near future, this information will be utilized to begin deciphering the wiring diagram of the brain by using nano-resolution x-ray tomography.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
EditorsIan McNulty, Catherine Eyberger, Barry Lai
Place of PublicationUnited States
PublisherAIP Publishing
Number of pages4
ISBN (Print)9780735409255
Publication statusPublished - 2011
Externally publishedYes
Event10th International Conference on X-ray Microscopy - Chicago, Chicago, United States
Duration: 15 Aug 201020 Aug 2010

Publication series

NameAIP Conference Proceedings
ISSN (Print)0094-243X


Conference10th International Conference on X-ray Microscopy
Country/TerritoryUnited States


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