Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source

Hiroaki Kuwabara*, Wataru Yashiro, Sébastien Harasse, Haruo Mizutani, Atsushi Momose

*Corresponding author for this work

Research output: Contribution to journalArticleResearchpeer-review

21 Citations (Scopus)

Abstract

We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.

Original languageEnglish
Article number062502
JournalApplied Physics Express
Volume4
Issue number6
DOIs
Publication statusPublished - Jun 2011
Externally publishedYes

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