Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source

Hiroaki Kuwabara, Wataru Yashiro, Sébastien Harasse, Haruo Mizutani, Atsushi Momose

Research output: Contribution to journalArticleResearchpeer-review

19 Citations (Scopus)

Abstract

We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.

Original languageEnglish
Article number062502
JournalApplied Physics Express
Volume4
Issue number6
DOIs
Publication statusPublished - Jun 2011
Externally publishedYes

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x ray sources
Microscopic examination
microscopy
X rays
Microscopes
microscopes
gratings
x rays
phase contrast
materials science
Imaging techniques

Cite this

Kuwabara, Hiroaki ; Yashiro, Wataru ; Harasse, Sébastien ; Mizutani, Haruo ; Momose, Atsushi. / Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source. In: Applied Physics Express. 2011 ; Vol. 4, No. 6.
@article{bc04361d63c9474599a565ace4504476,
title = "Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source",
abstract = "We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.",
author = "Hiroaki Kuwabara and Wataru Yashiro and S{\'e}bastien Harasse and Haruo Mizutani and Atsushi Momose",
year = "2011",
month = "6",
doi = "10.1143/APEX.4.062502",
language = "English",
volume = "4",
journal = "Applied Physics Express",
issn = "1882-0778",
publisher = "Japan Society of Applied Physics",
number = "6",

}

Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source. / Kuwabara, Hiroaki; Yashiro, Wataru; Harasse, Sébastien; Mizutani, Haruo; Momose, Atsushi.

In: Applied Physics Express, Vol. 4, No. 6, 062502, 06.2011.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Hard-x-ray phase-difference microscopy with a low-brilliance laboratory x-ray source

AU - Kuwabara, Hiroaki

AU - Yashiro, Wataru

AU - Harasse, Sébastien

AU - Mizutani, Haruo

AU - Momose, Atsushi

PY - 2011/6

Y1 - 2011/6

N2 - We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.

AB - We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields.

UR - http://www.scopus.com/inward/record.url?scp=79958790862&partnerID=8YFLogxK

U2 - 10.1143/APEX.4.062502

DO - 10.1143/APEX.4.062502

M3 - Article

VL - 4

JO - Applied Physics Express

JF - Applied Physics Express

SN - 1882-0778

IS - 6

M1 - 062502

ER -