Development of computer tomography system for the soft X-ray microscope at ritsumeikan university

T. Ohigashi*, H. Fujii, Kengo Usui, H. Namba, H. Mizutani, Steven K. Takemoto, H. Kihara

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

3 Citations (Scopus)


A synchrotron-based full-field imaging soft x-ray microscope was tuned appropriately to perform computer tomography. The contrast and focal depth of the optical system were evaluated by using a Fresnel zone plate as a test object of variable spatial frequency. A focal depth of 15 μm was obtained at the spatial frequency of 4.3μm-1 according to Rayleigh's criterion. As a first trial of three-dimensional observation using this system, the cerebral cortex of the brain of a mouse, trimmed to a columnar shape by focused ion beam milling, was studied using a wavelength of 1.87-nm.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
EditorsIan McNulty, Catherine Eyberger, Barry Lai
PublisherAIP Publishing
Number of pages4
ISBN (Print)9780735409255
Publication statusPublished - 2011
Externally publishedYes
Event10th International Conference on X-ray Microscopy - Chicago, Chicago, United States
Duration: 15 Aug 201020 Aug 2010


Conference10th International Conference on X-ray Microscopy
Country/TerritoryUnited States


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